System level testing is becoming increasingly important. It is driven by the incessant march of complexity ... which is forcing us to renew our thinking on the processes and procedures that we apply to test and diagnosis of systems. In fact, the complexity defines the system itself which, for our purposes, is ¿any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail . System approaches embody the partitioning of problems into smaller inter-related subsystems that will be solved together. Thus, words like hierarchical, dependence, inference, model, and partitioning are frequent throughout this text. Each of the authors deals with the complexity issue in a similar fashion, but the real value in a collected work such as this is in the subtle differences that may lead to synthesized approaches that allow even more progress. The works included in this volume are an outgrowth of the 2nd International Workshop on System Test and Diagnosis held in Alexandria, Virginia in April 1998. The first such workshop was held in Freiburg, Germany, six years earlier. In the current workshop nearly 50 experts from around the world struggled over issues concerning the subject... In this volume, a select group of workshop participants was invited to provide a chapter that expanded their workshop presentations and incorporated their workshop interactions... While we have attempted to present the work as one volume and requested some revision to the work, the content of the individual chapters was not edited significantly. Consequently, you will see different approaches to solving the same problems and occasional disagreement between authors as to definitions or the importance of factors. ... The works collected in this volume represent the state-of-the-art in system test and diagnosis, and the authors are at the leading edge of that science...". From the Preface220.951220.95John W Sheppard04812794-BFD8-4230-8A27-89C66F8EFCA0978079238306297807923830690007115, 126.67TCHardcoverCouverture rigideEB30542ABE974D5EBCCC491EEF9F4DBESpringer USSpringer1360.599.526.360.90.599.526.36111998-10-31T05:00:00ZMethodology for the Modeling and Simulation of MicrosystemsP10175Home & GardeningGARDREF01AGarden ReferenceGAR000000, TEC007000, TEC008010ElectronicsBooks > Science & Nature > Science > Technology > Superconductorshttps://dynamic. indigoimages. ca/books/0792383060.jpg?scaleup=true&width=600&quality=85&lang=enhttps://dynamic. indigoimages. ca/books/0792383060.jpg?scaleup=true&width=600&quality=85&lang=frhttps://www. indigo. ca/en-ca/methodology-for-the-modeling-and-simulation-of-microsystems/9780792383062.htmlhttps://www. indigo. ca/fr-ca/methodology-for-the-modeling-and-simulation-of-microsystems/9780792383062.htmlOver the past two decades, technologies for microsystems fabrication have made considerable progress. This has made possible a large variety of new commercial devices ranging, for example, from integrated pressure and acceleration microsensors to active micromirror arrays for image projection. In the near future, there will be a number of new devices, which will be commercialized in many application areas. The field of microsystems is characterized by its wide diversity, which requires a multidisciplinary approach for design and processes as well as in application areas. Although there is a common technological background derived from integrated circuits, it is clear that microsystems will require additional application-specific technologies. Since most microsystem technologies are based on batch processing and dedicated to mass production, prototyping is likely to be an expensive and time-consuming step. It is recognized that standardization of the processes as well as of the design tools will definitely help reduce the entry cost of microsystems. This creates a very challenging situation for the design, modeling and simulation of microsystems. Methodology for the Modeling and Simulation of Microsystems is the first book to give an overview of the problems associated with modeling and simulation of microsystems. It introduces a new methodology, which is supported by several examples. It should provide a useful starting point for both scientists and engineers seeking background information for efficient design of microsystems.142.951142.95Bartlomiej F Romanowicz6F939388-AC23-4395-8C91-2C7F4AA6BC7A978079238319297807923831990007115, 194.06TCHardcoverCouverture rigideAD099822DA974C47995C43210412604DSpringer USSpringer2620.869.616.371.290.869.616.37111998-10-31T05:00:00ZAnalysis Of Subsynchronous Resonance In Power SystemsP10117Science & NatureSCIENCE02AMath & PhysicsMAT000000, TEC007000ElectricalBooks > Science & Nature > Science > | Research Perspectives and Case | Research Perspectives and Case Studies in System Test and Diagnosis by M. Campieri, Hardcover | Indigo Chapters